Discover our latest solutions in Enova Paris 2015

All of these new additions, as well as the core of ENOVA PARIS, will be there to help start-ups, businesses, technology developers, digital stakeholders, research laboratories, designers and entrepreneurs come together and explore new usages and services, creating the perfect climate for doing business, co-building an innovative and competitive industrial project and launching cross-disciplinary initiatives. With 6,000 targeted and qualified decision-makers and 450 businesses, ENOVA PARIS is the ideal place to discover technological innovations and launch projects advocating the services and usages of tomorrow.

Innovalia Metrology will present the latest metrology solutions and products at the stand H11 at the Metrology Village of Enova Paris that will take place during the days 22-24 of September in the capital. During these three days, visitors will discover the system M3 portable, a high precision standalone 3D scanning system, equipped with M3 platform (Multisensor Massive Measurement), perfect to optimize the measurement processes in a natural and efficient way, with the optical sensor Optiscan, whose unique design allows the integration into any system for both laboratory and in-line manufacturing and with Tetracheck, the most effective and innovative verification system for your coordinate measurement machine in just 5 minutes.