Innovalia Metrology systems and metrology solutions are designed to provide our customers with a guarantee of measurement accuracy for parts and components that are vital to the manufacturing process, and to enable the achievement of higher levels of productivity and efficiency in production processes.
Innovalia Metrology is a strategic alliance between Trimek, Datapixel and Unimetrik – three Innovalia Group companies that have joined forces to offer our customers with best-in-class metrology solutions. Innovalia Metrology offers metrology solutions that integrate traditional metrology with the latest technological developments, from laboratories to production lines.
Innovalia Metrology is composed of the companies
Sensor Engineering and Quality Control
Datapixel offers leading edge non-contact measurement systems and 3D scanning solutions. Our solutions are designed to help manufacturing organisations to reduce their time-to-market and their overall production costs, and to improve the quality of their products.
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Design and Manufacturing of CMM Machines
Trimek designs, manufactures and supplies components and integrated solutions that enable customers to improve their quality control processes and dimensional metrology capabilities. By continuously investing in R&D, we ensure our customers have access to the most advanced solutions.
Calibration, Measurement, Verification and Certification Laboratory
Unimetrik is an ENAC-accredited laboratory that provides calibration, advanced measurement and metrology engineering services and solutions to industry. Utilising the latest technology and with highly qualified staff, Unimetrik, is able to guarantee maximum service rigour and reliability.
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The goal of this collaboration is to experiment with 5G technology in the context of Metrology Zero Defect Manufacturing (ZDM) services and solutions for Industry. For these purposes, Innovalia collaborates by providing access to Metrology 4.0 solutions such as M3 Hybrid, a solution formed by a CMM, an optical sensor for the capture of point […]
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