Metromeet 2020 comes to its end hand in hand with the most important representatives of the Industry

Metromeet has welcomed some of the leader companies of the field as Innovalia Metrology, Autodesk, General Electric, Tekniker or Topsolid. Also responsibles from the most important institutions such as the PTB, the University of Nottingham or the University of Antwerp.

The conference addressed some of the challenges that companies face today by adopting smart Metrology technologies. Topics such as predictive maintenance or interoperability have been key for those companies that are looking to make the leap to digital optimized production. The event offered the possibility to connect and discover technology, solutions and applications in an industrial environment.
Toni Ventura, CEO of Datapixel, opened the Conference with a charismatic Tutorial in which he showed the way to Zero Defects thanks to Metrology and ended his speech by “Some years ago Metrology was only present in laboratories, but today it is an essential process in production“.
The 16th edition of Metromeet has also been highlighted by new content that has generated a lot of interest and expectation. Jennifer Herron brought from Colorado (United States) a great presentation about QIF manufacturing standards. Ainhoa Etxabarri started the second day of Metromeet with a Master Workshop “Metrology in Machining“.
After bringing such attractive topics to the table as hybrid measurement, QIF, software solutions for 3D printing and Industry 4.0, the round table formed by Jesús de la Maza, Toni Ventura and Jennifer Herron, closed the Conference for the two first days.
The last day of the Conference took place at Bodegas Valdemar where the attendees enjoyed innovative content thanks to speakers such as Rafael García, applications engineer at MSI, participating in the R4 clio project, Camilo Prieto, from AIMEN, presented “Integration of Metrology in large pilots of metal additive manufacturing lines “.
Metromeet has managed with these 3 days of Conference, to draw conclusions about the main needs of the sector and to debate about the future of metrology with professionals with different perceptions and different experiences.

See full review of the Conference